testing digital semiconductors

The 3 day  Digital Test Technology Course is designed to provide a foundation of knowledge that is fundamental to all aspects of semiconductor test engineering. In order to meet the testing challenges of modern SOC circuits, digital component test has made significant advances over the past few years. In addition to the tried and true test methodologies of the past, engineers must now understand topics such as Defect Oriented Testing, Fault Coverage, Design-for-Testability, IDDQ and Structural Test. These topics have moved from the “experimental” phase into mainstream test and are now introduced in this course. Lecture begins with an overview of the Semiconductor and ATE industry. ATE system architecture and functionality are explained along with the terminology used to describe semiconductor testing. Interpreting device specifications is emphasized and discussed with each test procedure. DC, AC and Functional tests are explained in detail and various test methods are discussed along with the advantage and disadvantage of each method. Device characterization, yield analysis, debug techniques, datalogs and shmoo plots are also explained. Proper programming practices that minimize test times, insure test integrity and produce safe, reliable test sequences are taught throughout.